Title: Soft gate oxide breakdown as a lifetime-limiting event in dynamic CMOS logic
Authors: Kaczer, Ben ×
Groeseneken, Guido #
Issue Date: Dec-2003
Publisher: IEEE
Conference: Semiconductor Interface Specialists Conference location:Leuven Belgium date:04/12/03
Publication status: published
KU Leuven publication type: IC
Appears in Collections:Electrical Engineering - miscellaneous
ESAT - MICAS, Microelectronics and Sensors
× corresponding author
# (joint) last author

Files in This Item:

There are no files associated with this item.

Request a copy


All items in Lirias are protected by copyright, with all rights reserved.