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Title: Impact of stochastic mismatch on measured SRAM performance of FinFETs with resist/spacer-defined Fins: role of line-edge-roughness
Authors: Dixit, Abhisek ×
Kottantharayil, Anil
Baravelli, Emanuele
Roussel, Philippe
Mercha, Abdelkarim
Gustin, Cedric
Bamal, Mandeep
Grossar, Evelyn
Rooyackers, Rita
Augendre, Emmanuel
Jurczak, Malgorzata
Biesemans, Serge
De Meyer, Christina #
Issue Date: 2006
Publisher: IEEE
Conference: International Electron Devices Meeting - IEDM. Technical Digest location:Leuven Belgium date:11/12/06
Publication status: published
KU Leuven publication type: IC
Appears in Collections:Electrical Engineering - miscellaneous
Associated Section of ESAT - INSYS, Integrated Systems
× corresponding author
# (joint) last author

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