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|ITEM METADATA RECORD
|Title: ||Impact of stochastic mismatch on measured SRAM performance of FinFETs with resist/spacer-defined Fins: role of line-edge-roughness|
|Authors: ||Dixit, Abhisek ×|
De Meyer, Christina #
|Issue Date: ||2006 |
|Conference: ||International Electron Devices Meeting - IEDM. Technical Digest location:Leuven Belgium date:11/12/06|
|Publication status: ||published|
|KU Leuven publication type: ||IC|
|Appears in Collections:||Electrical Engineering - miscellaneous|
Associated Section of ESAT - INSYS, Integrated Systems
× corresponding author|
# (joint) last author|
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