Title: Investigation of properties of SiO2 defects created during electric stressing at different temperatures
Authors: Kaczer, Ben
Degraeve, Robin
Pangon, Nadège
Groeseneken, Guido
Issue Date: 1999
Conference: Semiconductor Interface Specialists' Conference; December 1999; Charleston, SC, USA. location:Leuven Belgium
Publication status: published
KU Leuven publication type: DI
Appears in Collections:Electrical Engineering - miscellaneous
ESAT - MICAS, Microelectronics and Sensors

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