Title: Investigation of temperature acceleration of thin oxide time-to-breakdown
Authors: Kaczer, Ben ×
Degraeve, Robin
Pangon, Nadège
Nigam, Tanya
Groeseneken, Guido #
Issue Date: 1999
Series Title: Microelectronic Engineering vol:48 issue:01/04/07 pages:47-50
ISSN: 0167-9317
Publication status: published
KU Leuven publication type: IT
Appears in Collections:Electrical Engineering - miscellaneous
ESAT - MICAS, Microelectronics and Sensors
× corresponding author
# (joint) last author

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