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Title: Reliability comparison of triple-gate versus planar SOI FETs
Authors: Crupi, Felice ×
Kaczer, Ben
Degraeve, Robin
Subramanian, Vaidy
Srinivasan, Purushothaman
Simoen, Eddy
Dixit, Abhisek
Jurczak, Malgorzata
Groeseneken, Guido #
Issue Date: Sep-2006
Series Title: IEEE Transactions on Electron Devices vol:53 issue:9 pages:2351-2357
ISSN: 0018-9383
Publication status: published
KU Leuven publication type: IT
Appears in Collections:Electrical Engineering - miscellaneous
ESAT - MICAS, Microelectronics and Sensors
× corresponding author
# (joint) last author

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