Title: Investigation of instrinsic transistor performance of advanced CMOS devices with 2.5 nm NO gate oxides
Authors: Kubicek, Stefan ×
Henson, W. K
De Keersgieter, An
Badenes, Gonçal
Jansen, Philippe
Van Meer, Hans
Kerr, Daniel
Naem, Abdalla
Deferm, Ludo
De Meyer, Kristin #
Issue Date: 1999
Conference: International Electron Devices Meeting. Technical Digest; 5-8 Dec. 1999; Washington, D.C., USA. location:Leuven Belgium
Publication status: published
KU Leuven publication type: IC
Appears in Collections:Electrical Engineering - miscellaneous
Associated Section of ESAT - INSYS, Integrated Systems
× corresponding author
# (joint) last author

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