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Title: Physical modeling of retention in localized trapping nitride memory devices
Authors: Furnemont, Arnaud ×
Rosmeulen, Maarten
van der Zanden, Koen
Van Houdt, Jan
De Meyer, Christina
Maes, Herman #
Issue Date: 2006
Publisher: IEEE
Host Document: pages:14/06/01-14/06/04
Conference: International Electron Devices Meeting - IEDM. Technical Digest location:Leuven Belgium date:11/12/06
Publication status: published
KU Leuven publication type: IC
Appears in Collections:Electrical Engineering - miscellaneous
Associated Section of ESAT - INSYS, Integrated Systems
× corresponding author
# (joint) last author

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