Title: Accelerated Ageing with In Situ Electrical Testing: A Powerful Tool for the Building-In Approach to Quality and Reliability in Electronics
Authors: De Schepper, Luc ×
De Ceuninck, Ward
Lekens, Geert
Stals, Lambert
Vanhecke, Bruno
Roggen, Jean
Beyne, Eric
Tielemans, Luc #
Issue Date: 1994
Series Title: Quality and Reliability Engineering International vol:10 issue:1 pages:15-26
Publication status: published
KU Leuven publication type: IT
Appears in Collections:Physics and Astronomy - miscellaneous
× corresponding author
# (joint) last author

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