|ITEM METADATA RECORD
|Title: ||Accelerated Ageing with In Situ Electrical Testing: A Powerful Tool for the Building-In Approach to Quality and Reliability in Electronics|
|Authors: ||De Schepper, Luc ×|
De Ceuninck, Ward
Tielemans, Luc #
|Issue Date: ||1994 |
|Series Title: ||Quality and Reliability Engineering International vol:10 issue:1 pages:15-26|
|Publication status: ||published|
|KU Leuven publication type: ||IT|
|Appears in Collections:||Physics and Astronomy - miscellaneous|
× corresponding author|
# (joint) last author|
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