Title: Turn-off characteristics of the CMOS snapback ESD protection devices - new insights and its implications
Authors: Vashchenko, Vladislav ×
Scholz, Mirko
Jansen, Philippe
Petersen, Rainer
Mahadeva Iyer, Natarajan
Tremouilles, David
Sawada, Masanori
Nakaei, Toshiyuki
Hasebe, Takumi
Ter Beek, Marcel
Groeseneken, Guido #
Issue Date: Sep-2006
Publisher: ESDA
Host Document: pages:39-45
Conference: 28th Electrical Overstress/Electrostatic Discharge Symposium Proceedings location:Santa Clara, CA USA date:10/09/06
Publication status: published
KU Leuven publication type: IC
Appears in Collections:Electrical Engineering - miscellaneous
ESAT - MICAS, Microelectronics and Sensors
× corresponding author
# (joint) last author

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