Title: Impact of new technology options on the ESD robustness of sub-45 nm FinFET technology
Authors: Tremouilles, David ×
Mahadeva Iyer, Natarajan
Linten, Dimitri
Scholz, Mirko
Groeseneken, Guido #
Issue Date: May-2006
Conference: EOS/ESD/EMI Workshop location:Leuven Belgium
Publication status: published
KU Leuven publication type: IMa
Appears in Collections:Electrical Engineering - miscellaneous
ESAT - MICAS, Microelectronics and Sensors
× corresponding author
# (joint) last author

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