Title: Analysis of Externally Imposed Mechanical Stress Effects on the Hot-Carrier-Induced Degradation of MOSFETs
Authors: Degraeve, Robin ×
De Wolf, Ingrid
Groeseneken, Guido
Maes, Herman #
Issue Date: 1994
Publisher: IEEE
Host Document: pages:29-33
Conference: Proceedings International Reliability Physics Symposium - IRPS location:Leuven Belgium date:11/04/94
Publication status: published
KU Leuven publication type: IC
Appears in Collections:Associated Section of ESAT - INSYS, Integrated Systems
ESAT - MICAS, Microelectronics and Sensors
× corresponding author
# (joint) last author

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