| ITEM METADATA RECORD |
| Title: | Characterization of charge trapping in SiO2/HfO2 dielectrics |
| Authors: | Degraeve, Robin ×
Kerber, Andreas
Cartier, Ed
Pantisano, Luigi
Groeseneken, Guido # |
| Issue Date: | 2003 |
| Publisher: | IEEE |
| Host Document: | pages:322-323 |
| Conference: | Proceedings International Semiconductor Device Research Symposium location:Leuven Belgium date:10/12/03 |
| Publication status: | published |
| KU Leuven publication type: | IC |
| Appears in Collections: | Electrical Engineering - miscellaneous
ESAT - MICAS, Microelectronics and Sensors
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× corresponding author |
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# (joint) last author |
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