Title: Characterization of charge trapping in SiO2/HfO2 dielectrics
Authors: Degraeve, Robin ×
Kerber, Andreas
Cartier, Ed
Pantisano, Luigi
Groeseneken, Guido #
Issue Date: 2003
Publisher: IEEE
Host Document: pages:322-323
Conference: Proceedings International Semiconductor Device Research Symposium location:Leuven Belgium date:10/12/03
Publication status: published
KU Leuven publication type: IC
Appears in Collections:Electrical Engineering - miscellaneous
ESAT - MICAS, Microelectronics and Sensors
× corresponding author
# (joint) last author

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