Title: Advanced Electrical Characterization Techniques for MOSFET's and MOSFET Reliability
Authors: Groeseneken, Guido
Issue Date: 1994
Conference: International Electron Devices Meeting (IEDM); December 11-14, 1994; San Francisco, Calif., USA. location:Leuven Belgium
Publication status: published
KU Leuven publication type: DI
Appears in Collections:ESAT - MICAS, Microelectronics and Sensors

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