|ITEM METADATA RECORD
|Title: ||Advanced Electrical Characterization Techniques for MOSFET's and MOSFET Reliability|
|Authors: ||Groeseneken, Guido|
|Issue Date: ||1994 |
|Conference: ||International Electron Devices Meeting (IEDM); December 11-14, 1994; San Francisco, Calif., USA. location:Leuven Belgium|
|Publication status: ||published|
|KU Leuven publication type: ||DI|
|Appears in Collections:||ESAT - MICAS, Microelectronics and Sensors|
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