Title: Understanding of the Hot-Carrier Degradation in Submicron MOSFET's : From Uniform Injection towards the Real Operating Conditions
Authors: Groeseneken, Guido ×
Bellens, Rudi
Van den bosch, G
Maes, Herman #
Issue Date: 1994
Host Document: pages:103-115
Conference: Proceedings of the European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (ESREF); October 4-7, 199 location:Leuven Belgium
Publication status: published
KU Leuven publication type: IC
Appears in Collections:ESAT - MICAS, Microelectronics and Sensors
Associated Section of ESAT - INSYS, Integrated Systems
× corresponding author
# (joint) last author

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