Title: Nanoscale Strain Characterization Using Transmission Electron Microscopy: The Software Package SIMCON
Authors: Janssens, Koenraad ×
Van der Biest, Omer
Vanhellemont, Jan
Maes, Herman #
Issue Date: 1994
Host Document: pages:997-998
Conference: Proceedings of the 13th International Conference on Electron Microscopy (ICEM); July 17-22, 1994; Paris, France. location:Leuven Belgium
Publication status: published
KU Leuven publication type: IC
Appears in Collections:Physical Metallurgy and Materials Engineering Section (-)
Associated Section of ESAT - INSYS, Integrated Systems
× corresponding author
# (joint) last author

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