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Title: Impact of the gate-dielectric interface on the low-frequency noise of thin gate oxide n-channel metal-oxide-semiconductor field-effect transistors
Authors: Simoen, Eddy
Srinivasan, Purushothaman
Misra, D
Claeys, Corneel
Issue Date: 2006
Conference: ULIS - 7th European Workshop on Ultimate Integration of Silicon location:Leuven Belgium date:20/04/06
Publication status: published
KU Leuven publication type: IMa
Appears in Collections:Associated Section of ESAT - INSYS, Integrated Systems

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