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IEEE Journal of Solid-State Circuits

Publication date: 2003-03-01
Volume: 38 Pages: 483 - 494
Publisher: Ieee-inst electrical electronics engineers inc

Author:

Uyttenhove, K
Vandenbussche, J ; Lauwers, Erik ; Gielen, Georges ; Steyaert, MSJ

Keywords:

a/d converters, flash and advanced simulated annealing, interpolating, analog integrated-circuits, Science & Technology, Technology, Engineering, Electrical & Electronic, Engineering, A/D converters, 0204 Condensed Matter Physics, 0906 Electrical and Electronic Engineering, 1099 Other Technology, Electrical & Electronic Engineering, 4009 Electronics, sensors and digital hardware

Abstract:

The design issues and tradeoffs of a high-speed high-accuracy Nyquist-rate analog-to-digital converter (AID) converter are described. The presented design methodology covers the complete flow from specifications to verified layout and is supported by both commercial and internally developed computer-aided design tools. The major decisions to be made during the converter's design at both the architectural and the circuit level are described and the tradeoffs are elaborated. The approach is demonstrated for a real-life test case, where a Nyquist-rate 8-bit 200-MS/s 4-2 interpolating/averaging A/D converter was developed in a 0.35-mum CMOS technology. The signal-to-noise-plus-distortion ratio at 40 MHz is 42.7 dB and the total power consumption-is 655 mW.