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Physical Review Applied

Publication date: 2017-01-01
Publisher: Amer Physical Soc

Author:

Lu, Anh Khoa Augustin
Houssa, Michel ; Luisier, Mathieu ; Pourtois, Geoffrey

Keywords:

Science & Technology, Physical Sciences, Physics, Applied, Physics, TRANSITION-METAL DICHALCOGENIDES, 02 Physical Sciences, 09 Engineering, 40 Engineering, 51 Physical sciences

Abstract:

© 2017 American Physical Society. Tunnel field-effect transistors based on van der Waals heterostructures are emerging device concepts for low-power applications, auguring sub-60 mV/dec subthreshold swing values. In these devices, the channel is built from a stack of several different two-dimensional materials whose nature allows tailoring the band alignments and enables a good electrostatic control of the device. In this work, we propose a theoretical study of the variability of the performances of a MoS2-ZrS2 tunnel field-effect transistor induced by fluctuations of the relative position or the orientation of the layers. Our results indicate that although a steep subthreshold slope (20 mV/dec) is achievable, fluctuations in the relative orientation of the ZrS2 layer with respect to the MoS2 one lead to a significant variability in the tunneling current by about one decade. This arises from changes in the orbital overlap between the layers and from the modulation of the transport direction.