ITEM METADATA RECORD
Title: Methodology to Validate and Inter-compare RF Device and Circuit Models
Authors: Schreurs, Dominique ×
Barciela, M
Vannini, G #
Issue Date: Jun-2005
Host Document: IEEE International Microwave Symposium Workshop on “Advances in RF Power Amplifiers: Modeling, Design and Linearization” pages:1-32
Conference: IEEE International Microwave Symposium Workshop on “Advances in RF Power Amplifiers: Modeling, Design and Linearization” location:Long Beach, CA, USA date:13 June 2005
Publication status: published
KU Leuven publication type: IC
Appears in Collections:ESAT- TELEMIC, Telecommunications and Microwaves
× corresponding author
# (joint) last author

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