Title: Analysing impact of MOSFET oxide breakdown by small- and large-signal HF measurements
Authors: Schreurs, Dominique ×
Pantisano, L
Kaczer, B #
Issue Date: Nov-2004
Host Document: Automatic RF Techniques Group Conference (ARFTG) pages:85-91
Conference: Automatic RF Techniques Group Conference (ARFTG) location:Orlando, FL, USA date:30 November - 3 December 2004
Publication status: published
KU Leuven publication type: IC
Appears in Collections:ESAT- TELEMIC, Telecommunications and Microwaves
× corresponding author
# (joint) last author

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