|ITEM METADATA RECORD
|Title: ||Analysing impact of MOSFET oxide breakdown by small- and large-signal HF measurements|
|Authors: ||Schreurs, Dominique ×|
Kaczer, B #
|Issue Date: ||Nov-2004 |
|Host Document: ||Automatic RF Techniques Group Conference (ARFTG) pages:85-91|
|Conference: ||Automatic RF Techniques Group Conference (ARFTG) location:Orlando, FL, USA date:30 November - 3 December 2004|
|Publication status: ||published|
|KU Leuven publication type: ||IC|
|Appears in Collections:||ESAT- TELEMIC, Telecommunications and Microwaves|
× corresponding author|
# (joint) last author|
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