Title: Some measurement results for frequency-dependent inductance of IC interconnects on a lossy silicon substrate
Authors: De Roest, David ×
Ymeri, Hassan
Vandenberghe, Servaas
Stucchi, M.
Schreurs, Dominique
Maex, Karen
Nauwelaers, Bart #
Issue Date: Feb-2002
Publisher: Institute of Electrical and Electronics Engineers
Series Title: IEEE Electron Device Letters vol:23 issue:2 pages:103-104
ISSN: 0741-3106
Publication status: published
KU Leuven publication type: IT
Appears in Collections:ESAT- TELEMIC, Telecommunications and Microwaves
Electrical Engineering - miscellaneous
Associated Section of ESAT - INSYS, Integrated Systems
× corresponding author
# (joint) last author

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