Title: On the frequency dependent line admittance of VLSI interconnect lines on silicon based semiconductor substrates
Authors: Ymeri, Hassan ×
Nauwelaers, Bart
Maex, Karen #
Issue Date: 6-May-2002
Publisher: Mackintosh Publications
Series Title: Microelectronics journal vol:33 issue:5-6 pages:449-458
ISSN: 0026-2692
Publication status: published
KU Leuven publication type: IT
Appears in Collections:ESAT- TELEMIC, Telecommunications and Microwaves
Associated Section of ESAT - INSYS, Integrated Systems
Electrical Engineering - miscellaneous
× corresponding author
# (joint) last author

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