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Title: Accurate RF electrical characterisation of CSPs using MCM-D thin film technology
Authors: Chandrasekhar, Arun ×
Beyne, E
De Raedt, W
Nauwelaers, Bart #
Issue Date: Feb-2004
Publisher: Institute of Electrical and Electronics Engineers
Series Title: IEEE transactions on advanced packaging vol:27 issue:1 pages:203-212
ISSN: 1521-3323
Publication status: published
KU Leuven publication type: IT
Appears in Collections:ESAT- TELEMIC, Telecommunications and Microwaves
× corresponding author
# (joint) last author

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