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Title: The influence of packaging materials on RF performance
Authors: Chandrasekhar, Arun ×
Brebels, S
Stoukatch, S
Beyne, E
De Raedt, W
Nauwelaers, Bart #
Issue Date: 5-Mar-2003
Series Title: Microelectronics Reliability vol:43 issue:3 pages:351-357
ISSN: 0026-2714
Publication status: published
KU Leuven publication type: IT
Appears in Collections:ESAT- TELEMIC, Telecommunications and Microwaves
× corresponding author
# (joint) last author

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