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Title: Simple and efficient approach for shunt admittance parameters calculations of VLSI on-chip interconnects on semiconducting substrate
Authors: Ymeri, Hassan
Nauwelaers, Bart
Maex, Karen
De Roest, David
Stucchi, M
Vandenberghe, Servaas #
Issue Date: Mar-2002
Host Document: International Conference on Design, Automation and Test in Europe (DATE 2002)
Conference: International Conference On Design, Automation And Test In Europe (DATE ) location:Paris, France date:4-8 March 2002
Publication status: published
KU Leuven publication type: IC
Appears in Collections:ESAT- TELEMIC, Telecommunications and Microwaves
Associated Section of ESAT - INSYS, Integrated Systems
Electrical Engineering - miscellaneous
# (joint) last author

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