Title: RF Performance Vulnerability to Hot Carrier Stress and Consequent Breakdown in Low power 90 nm RF CMOS
Authors: Pantisano, L ×
Schreurs, Dominique
Kaczer, B
Jeamsaksiri, W
Venegas, R
Degraeve, R
Cheung, K.P
Groeseneken, Guido #
Issue Date: Dec-2003
Host Document: IEEE International Electron Devices Meeting (IEDM) pages:7.7.1-7.7.4
Conference: IEEE International Electron Devices Meeting (IEDM) location:Washington DC, USA date:7-10 December 2003
Publication status: published
KU Leuven publication type: IC
Appears in Collections:ESAT- TELEMIC, Telecommunications and Microwaves
Electrical Engineering - miscellaneous
ESAT - MICAS, Microelectronics and Sensors
× corresponding author
# (joint) last author

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