ITEM METADATA RECORD
Title: Easy and accurate empirical transistor model parameter estimation from vectorial large-signal measurements
Authors: Schreurs, Dominique
Verspecht, J
Vandenberghe, Servaas
Carchon, Geert
Van der Zanden, K
Nauwelaers, Bart #
Issue Date: Jun-1999
Host Document: IEEE Microwave Theory and Techniques Symposium (MTT-S) pages:753-756
Conference: IEEE Microwave Theory and Techniques Symposium (MTT-S) location:Anaheim, CA, USA date:13-19 June 1999
Publication status: published
KU Leuven publication type: IC
Appears in Collections:Electrical Engineering - miscellaneous
ESAT- TELEMIC, Telecommunications and Microwaves
# (joint) last author

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