Title: Influence of RF Measurement Uncertainties on Model Uncertainties: Practical case of a SiGe HBT
Authors: Schreurs, Dominique
Hussain, H
Taher, Hany
Nauwelaers, Bart #
Issue Date: Nov-2004
Host Document: Automatic RF Techniques Group Conference (ARFTG) pages:33-39
Conference: Automatic RF Techniques Group Conference (ARFTG) location:Orlando, FL, USA date:30 November - 3 December 2004
Publication status: published
KU Leuven publication type: IC
Appears in Collections:ESAT- TELEMIC, Telecommunications and Microwaves
# (joint) last author

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