ITEM METADATA RECORD
Title: Influence of RF Measurement Uncertainties on Model Uncertainties: Practical case of a SiGe HBT
Authors: Schreurs, Dominique
Hussain, H
Taher, Hany
Nauwelaers, Bart #
Issue Date: Nov-2004
Host Document: Automatic RF Techniques Group Conference (ARFTG) pages:33-39
Conference: Automatic RF Techniques Group Conference (ARFTG) location:Orlando, FL, USA date:30 November - 3 December 2004
Publication status: published
KU Leuven publication type: IC
Appears in Collections:ESAT- TELEMIC, Telecommunications and Microwaves
# (joint) last author

Files in This Item:

There are no files associated with this item.

Request a copy

 




All items in Lirias are protected by copyright, with all rights reserved.

© Web of science