ITEM METADATA RECORD
Title: Hot carrier stress and breakdown impact on high-frequency MOSFET analog performance
Authors: Pantisano, L ×
Schreurs, Dominique
Kaczer, B
Simoen, E
Groeseneken, Guido #
Issue Date: Oct-2004
Host Document: ECS Symposium I1: first international symposium on dielectrics for nanosystems: materials science, processing, reliability and manufacturing pages:224-238
Conference: ECS Symposium I1: first international symposium on dielectrics for nanosystems: materials science, processing, reliability and manufacturing location:Honolulu, HI, USA date:3-8 October 2004
Publication status: published
KU Leuven publication type: IC
Appears in Collections:ESAT - MICAS, Microelectronics and Sensors
ESAT- TELEMIC, Telecommunications and Microwaves
× corresponding author
# (joint) last author

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