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Title: Reliable extraction of RF figures-of-merit for MOSFETs
Authors: Vandamme, Ewout
Schreurs, Dominique
Nauwelaers, Bart
van Dinther, C
Badenes, G
Deferm, L #
Issue Date: Sep-1999
Host Document: European Solid-State Device Research Conference (ESSDERC) pages:660-663
Conference: European Solid-State Device Research Conference (ESSDERC) edition:29 location:Leuven, Belgium date:13-15 September 1999
Publication status: published
KU Leuven publication type: IC
Appears in Collections:ESAT- TELEMIC, Telecommunications and Microwaves
Electrical Engineering - miscellaneous
# (joint) last author

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