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Title: Characteristic impedance extraction using calibration comparison
Authors: Vandenberghe, Servaas
Schreurs, Dominique
Carchon, Geert
Nauwelaers, Bart
De Raedt, W #
Issue Date: May-2001
Host Document: Automatic RF Techniques Group Conference (ARFTG) pages:124-127
Conference: Automatic RF Techniques Group Conference (ARFTG) location:Phoenix, AZ, USA date:24-25 May 2001
Publication status: published
KU Leuven publication type: IC
Appears in Collections:ESAT- TELEMIC, Telecommunications and Microwaves
# (joint) last author

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