This item still needs to be validated !
ITEM METADATA RECORD
Title: Characteristic impedance extraction using calibration comparison
Authors: Vandenberghe, Servaas
Schreurs, Dominique
Carchon, Geert
Nauwelaers, Bart
De Raedt, W #
Issue Date: May-2001
Host Document: Automatic RF Techniques Group Conference (ARFTG) pages:124-127
Conference: Automatic RF Techniques Group Conference (ARFTG) location:Phoenix, AZ, USA date:24-25 May 2001
Publication status: published
KU Leuven publication type: IC
Appears in Collections:ESAT- TELEMIC, Telecommunications and Microwaves
# (joint) last author

Files in This Item:

There are no files associated with this item.

Request a copy

 




All items in Lirias are protected by copyright, with all rights reserved.