|ITEM METADATA RECORD
|Title: ||A Metric for Assessing the Degree of Device Nonlinearity and Improving Experimental Design|
|Authors: ||Schreurs, Dominique ×|
Williams, D.F #
|Issue Date: ||Jun-2004 |
|Host Document: ||IEEE International Microwave Symposium (IMS) pages:795-798|
|Conference: ||IEEE International Microwave Symposium (IMS) location:Forth Worth, TX, USA date:6-11 June 2004|
|Publication status: ||published|
|KU Leuven publication type: ||IC|
|Appears in Collections:||ESAT- TELEMIC, Telecommunications and Microwaves|
× corresponding author|
# (joint) last author|
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