Title: A Metric for Assessing the Degree of Device Nonlinearity and Improving Experimental Design
Authors: Schreurs, Dominique ×
Remley, K.A
Williams, D.F #
Issue Date: Jun-2004
Host Document: IEEE International Microwave Symposium (IMS) pages:795-798
Conference: IEEE International Microwave Symposium (IMS) location:Forth Worth, TX, USA date:6-11 June 2004
Publication status: published
KU Leuven publication type: IC
Appears in Collections:ESAT- TELEMIC, Telecommunications and Microwaves
× corresponding author
# (joint) last author

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