ITEM METADATA RECORD
Title: A Three-Step Procedure Utilizing Only Two Test Structures for De-embedding Transistor from On-wafer S-parameter Measurements
Authors: Myslinski, Maciej Tomasz ×
Wiatr, W
Schreurs, Dominique #
Issue Date: May-2004
Host Document: International Conference on Microwaves, Radar and Wireless Communications (MIKON) pages:674-677
Conference: International Conference on Microwaves, Radar and Wireless Communications (MIKON) location:Warsaw, Poland date:17-19 May 2004
Publication status: published
KU Leuven publication type: IC
Appears in Collections:ESAT- TELEMIC, Telecommunications and Microwaves
× corresponding author
# (joint) last author

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