|ITEM METADATA RECORD
|Title: ||A Three-Step Procedure Utilizing Only Two Test Structures for De-embedding Transistor from On-wafer S-parameter Measurements|
|Authors: ||Myslinski, Maciej Tomasz ×|
Schreurs, Dominique #
|Issue Date: ||May-2004 |
|Host Document: ||International Conference on Microwaves, Radar and Wireless Communications (MIKON) pages:674-677|
|Conference: ||International Conference on Microwaves, Radar and Wireless Communications (MIKON) location:Warsaw, Poland date:17-19 May 2004|
|Publication status: ||published|
|KU Leuven publication type: ||IC|
|Appears in Collections:||ESAT- TELEMIC, Telecommunications and Microwaves|
× corresponding author|
# (joint) last author|
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