Title: Versatile RF measurement system to thoroughly evaluate the non-linear behaviour of SOI versus bulk CMOS technologies
Authors: Schreurs, Dominique
Vandenberghe, Servaas
Nauwelaers, Bart
Van Meer, Hans
Lyu, J
Kubicek, S
De Meyer, Christina #
Issue Date: Sep-1999
Host Document: European Solid-State Device Research Conference (ESSDERC) pages:376-379
Conference: European Solid-State Device Research Conference (ESSDERC) edition:29 location:Leuven, Belgium date:13-15 September 1999
Publication status: published
KU Leuven publication type: IC
Appears in Collections:Electrical Engineering - miscellaneous
ESAT- TELEMIC, Telecommunications and Microwaves
# (joint) last author

Files in This Item:

There are no files associated with this item.

Request a copy


All items in Lirias are protected by copyright, with all rights reserved.