Title: Accurate measurement and characterization of reciprocal 3-ports, application to CPW T-junctions in thin-film multi-layer MCM-D
Authors: Carchon, Geert
De Raedt, W
Nauwelaers, Bart #
Issue Date: Dec-2000
Host Document: Proceedings Asia Pacific Microwave Conference pages:453-456
Conference: Asia Pacific Microwave Conference location:Sydney, Australia date:3-6 December 2000
Publication status: published
KU Leuven publication type: IC
Appears in Collections:Electrical Engineering - miscellaneous
ESAT- TELEMIC, Telecommunications and Microwaves
# (joint) last author

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