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Title: Accuracy assessment of the BSIM3v3 MOSFET compact model for large signal RF applications
Authors: Vandamme, Ewout ×
Schreurs, Dominique
van Dinther, C #
Issue Date: Apr-2000
Host Document: Topical Meeting on Silicon Monolithic Integrated Circuits in RF Systems pages:152-155
Conference: Topical Meeting on Silicon Monolithic Integrated Circuits in RF Systems location:Garmisch. Germany date:26-28 April 2000
Publication status: published
KU Leuven publication type: IC
Appears in Collections:ESAT- TELEMIC, Telecommunications and Microwaves
Electrical Engineering - miscellaneous
× corresponding author
# (joint) last author

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