Title: Improved three-step de-embedding method to accurately account for the influence of pad parasitics in silicon on-wafer RF test-structures
Authors: Vandamme, E.P
Schreurs, Dominique ×
van Dinther, C #
Issue Date: Apr-2001
Publisher: Institute of Electrical and Electronics Engineers
Series Title: IEEE transactions on electron devices vol:48 issue:4 pages:737-742
ISSN: 0018-9383
Publication status: published
KU Leuven publication type: IT
Appears in Collections:ESAT- TELEMIC, Telecommunications and Microwaves
× corresponding author
# (joint) last author

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