Title: Characterising differences between measurement and calibration wafer in probe-tip calibrations
Authors: Carchon, Geert ×
Nauwelaers, Bart
De Raedt, W
Schreurs, Dominique
Vandenberghe, Servaas #
Issue Date: Jun-1999
Publisher: Institution of Electrical Engineers
Series Title: Electronics Letters vol:35 issue:13 pages:1087-1088
ISSN: 0013-5194
Publication status: published
KU Leuven publication type: IT
Appears in Collections:Electrical Engineering - miscellaneous
ESAT- TELEMIC, Telecommunications and Microwaves
× corresponding author
# (joint) last author

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