ITEM METADATA RECORD
Title: Compensating differences between measurement and calibration wafer in probe-tip calibrations - deembedding of line parameters
Authors: Carchon, Geert ×
Schreurs, Dominique
Vandenberghe, Servaas
Nauwelaers, Bart
De Raedt, Walter #
Issue Date: Oct-1998
Host Document: European Microwave Conference (EuMC) pages:1/259-1/264
Conference: European Microwave Conference edition:28 location:Amsterdam, The Netherlands date:5-9 October 1998
Publication status: published
KU Leuven publication type: IC
Appears in Collections:ESAT- TELEMIC, Telecommunications and Microwaves
Electrical Engineering - miscellaneous
× corresponding author
# (joint) last author

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