Title: Reliability testing of InP HEMT's using electrical stress methods
Authors: van der Zanden, K
Schreurs, Dominique ×
Menozzi, R
Borgarino, M #
Issue Date: Aug-1999
Publisher: Institute of Electrical and Electronics Engineers
Series Title: IEEE transactions on electron devices vol:46 issue:8 pages:1570-1576
ISSN: 0018-9383
Publication status: published
KU Leuven publication type: IT
Appears in Collections:ESAT- TELEMIC, Telecommunications and Microwaves
× corresponding author
# (joint) last author

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