Title: Impact of probe-to-pad contact degradation on the high frequency characteristics of RF MOSFETs and guidelines to avoid it
Authors: Vandamme, E.P *
Schreurs, Dominique * ×
van Dinther, C #
Issue Date: May-2001
Publisher: Wiley
Series Title: International Journal of RF and Microwave Computer-Aided Engineering vol:11 issue:3 pages:114-120
ISSN: 1096-4290
Publication status: published
KU Leuven publication type: IT
Appears in Collections:ESAT- TELEMIC, Telecommunications and Microwaves
* (joint) first author
× corresponding author
# (joint) last author

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