ITEM METADATA RECORD
Title: A Robust Integrated Multi-Bias Parameter Extraction Method for MESFET and HEMT Models
Authors: Van Niekerk, Cornell
Meyer, P
Schreurs, Dominique ×
Winson, P #
Issue Date: May-2000
Publisher: Professional Technical Group on Microwave Theory and Techniques, Institute of Electrical and Electronics Engineers
Series Title: IEEE transactions on microwave theory and techniques vol:48 issue:5 pages:777-786
ISSN: 0018-9480
Publication status: published
KU Leuven publication type: IT
Appears in Collections:ESAT- TELEMIC, Telecommunications and Microwaves
× corresponding author
# (joint) last author

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