ITEM METADATA RECORD
Title: A new approach for the calculation of line capacitances of two-layer IC interconnects
Authors: Ymeri, Hassan ×
Nauwelaers, Bart
Maex, Karen
De Roest, David #
Issue Date: 5-Dec-2000
Publisher: Wiley
Series Title: Microwave and Optical Technology Letters vol:27 issue:5 pages:297-302
ISSN: 0895-2477
Publication status: published
KU Leuven publication type: IT
Appears in Collections:Electrical Engineering - miscellaneous
ESAT- TELEMIC, Telecommunications and Microwaves
Associated Section of ESAT - INSYS, Integrated Systems
× corresponding author
# (joint) last author

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