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Title: Correlation between the reliability of HEMT devices and that of a combined oscillator-amplifier MMIC
Authors: Schreurs, Dominique
De Raedt, W
Vandersmissen, Raf
Neuhaus, B
Beyer, A
Nauwelaers, Bart #
Issue Date: Sep-2001
Host Document: European Gallium Arsenide and related III-V compounds Applications Symposium (GaAs ) pages:183-186
Conference: European Gallium Arsenide and related III-V compounds Applications Symposium (GaAs ) location:London, U.K. date:24-28 September 2001
Publication status: published
KU Leuven publication type: IC
Appears in Collections:Associated Section of ESAT - INSYS, Integrated Systems
ESAT- TELEMIC, Telecommunications and Microwaves
# (joint) last author

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