Title: A new closed-form expression for capacitance per unit length of VLSI interconnects
Authors: Nauwelaers, Bart
Ymeri, Hassan
Maex, Karen #
Issue Date: 5-Mar-2001
Host Document: European Workshop Materials for Advanced Metallization (MAM 2001)
Conference: European Workshop Materials for Advanced Metallization (MAM ), pp. O2.2, 2p. location:Stockholm, Sweden date:5-8 March 2001
Publication status: published
KU Leuven publication type: IC
Appears in Collections:Electrical Engineering - miscellaneous
ESAT- TELEMIC, Telecommunications and Microwaves
Associated Section of ESAT - INSYS, Integrated Systems
# (joint) last author

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