Title: IoT: Source of Test Challenges
Authors: Marinissen, Erik
Cockburn, Peter
Hsieh, Ping-Hsuan
Huang, Chih-Tsun
Konijnenburg, Mario
Zorian, Yervant
Delvaux, Jeroen
Rozic, Vladimir
Yang, Bohan
Singelée, Dave
Verbauwhede, Ingrid
Mayor, Cedric
Van Rijsinge, Robert
Issue Date: 2016
Host Document: International IEEE European Test Symposium - ETS 2016
Conference: IEEE European Test Symposium date:May 23-27, 2016
Publication status: accepted
KU Leuven publication type: IC
Appears in Collections:ESAT - COSIC, Computer Security and Industrial Cryptography (+)

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