Title: Improved fault analysis on SIMON block cipher family
Authors: Chen, Hua
Feng, Jingyi
Rijmen, Vincent
Liu, Yunwen
Fan, Limin
Li, Wei
Issue Date: 2016
Publisher: IEEE
Host Document: International Workshop on Fault Diagnosis and Tolerance in Cryptography 2016
Conference: FDTC 2016 date:August 16, 2016
Publication status: accepted
KU Leuven publication type: IC
Appears in Collections:ESAT - COSIC, Computer Security and Industrial Cryptography (+)

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