ITEM METADATA RECORD
Title: Preface to the Focus Issue on Defect Characterization in Semiconductor Materials and Devices
Authors: Simoen, Eddy ×
De Gendt, Stefan #
Issue Date: 2016
Publisher: Electrochemical Society, Inc.
Series Title: ECS Journal of Solid State Science and Technology vol:5 issue:4 pages:Y3-Y4
ISSN: 2162-8769
Publication status: published
KU Leuven publication type: IT
Appears in Collections:Molecular Design and Synthesis
× corresponding author
# (joint) last author

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