Title: Convolution and deconvolution of bidirectional scatter distribution function data to enable inter-instrument comparisons
Authors: Audenaert, Jan
Hanselaer, Peter
Leloup, Frédéric
Issue Date: 1-Sep-2016
Publisher: CIE
Host Document: vol:484
Conference: CIE Expert Symposium on Colour and Visual Appearance edition:4 location:Prague date:6-7 September 2016
Article number: PO44
Abstract: Surface scattering properties are fully described and defined by the bidirectional scatter distribution function (BSDF), which encompasses both the bidirectional reflectance distribution function (BRDF) as well as the bidirectional transmittance distribution function (BTDF). Due to the lack of any standardization with regard to the optical design of BSDF measurement devices, several instruments have been introduced, each with different optical features. As such, experimentally determined BSDF data of the same sample acquired with different instruments can exhibit large variations. In this paper a method to transform measured BSDF data is proposed in order to enable a comparison between the BSDF data as obtained with different measurement devices.
Publication status: published
KU Leuven publication type: IC
Appears in Collections:Technologiecluster ESAT Elektrotechnische Engineering
Electrical Engineering (ESAT) TC, Technology Campuses Ghent and Aalst

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