Title: Spherical Wave Based Macromodels for Efficient System-Level EMC Analysis in Circuit Simulators Part II: Optimized Calculation of DUT–DUT Interactions
Authors: Boesman, Bart ×
Gielen, Georges
Vandenbosch, Guy
Pissoort, Davy #
Issue Date: 2-Jun-2016
Publisher: Institute of Electrical and Electronics Engineers
Series Title: IEEE Transactions on Electromagnetic Compatibility vol:58 issue:5 pages:1506-1516
Abstract: In this second part of two papers, the framework presented in Part I is extended with optimized routines that enable one to evaluate interactions between several devices under test (DUTs) through free space inside a circuit simulator environment, aimed at efficient system-level electromagnetic compatibility (EMC) analysis. Using a generalized scattering matrix formulation and an extensive understanding of the underlying theory of spherical wave expansions (SWEs), it is shown that the presented routines only add negligible computational cost to traditional scattering parameter simulations. The latter is obtained on the one hand by optimally truncating SWE based macromodels as described in Part I and on the other hand by observing that both near- and far-field interactions are only determined by a subset of parameters in the models. Therefore, this paper derives guidelines on the number of parameters needed to assure accurate simulations and validates them using two applications: 1) computing the radiated coupling between two DUTs; and 2) extending the first example in order to simulate efficiently a cylindrical scan of a DUT by an arbitrary measurement antenna.
ISSN: 0018-9375
Publication status: published
KU Leuven publication type: IT
Appears in Collections:Electrical Engineering (ESAT) TC, Campus Bruges
Technologiecluster ESAT Elektrotechnische Engineering
ESAT - MICAS, Microelectronics and Sensors
externen TMMA
ESAT- TELEMIC, Telecommunications and Microwaves
× corresponding author
# (joint) last author

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